Proceedings of the International Conference on Intelligent Systems and Digital Transformation (ICISD 2025)

Computer Vision Techniques for Enhanced Quality Control in Manufacturing Processes

Authors
Suneet Adithya Menon1, *, M. Krishna Ranjan1, Aman Kumar1, J. Arunnehru1
1Dept. of Computer Science and Engineering (E-TECH), SRM Institute of Science and Technology, Chennai, India
*Corresponding author. Email: suneetadithyamenon@gmail.com
Corresponding Author
Suneet Adithya Menon
Available Online 31 October 2025.
DOI
10.2991/978-94-6463-866-0_36How to use a DOI?
Keywords
computer vision; defect detection; quality control; image processing; leather manufacturing
Abstract

Effective quality control in luxury leather goods manufacturing requires objective assessment methodologies. This paper introduces an automated leather bag quality analysis system with a three-layer architecture: input for image preprocessing, processing for defect detection, and output for results visualization. By integrating threshold analysis with edge analysis, the system achieves comprehensive defect identification across varying leather textures. Results demonstrate the system’s ability to reliably detect material authenticity and surface defects while quantifying quality metrics with high precision. We conclude that approximately 95% of manual inspection inconsistencies can be eliminated through this approach. This methodology offers potential applications beyond leather goods to other natural material products requiring automated quality assessment.

Copyright
© 2025 The Author(s)
Open Access
Open Access This chapter is licensed under the terms of the Creative Commons Attribution-NonCommercial 4.0 International License (http://creativecommons.org/licenses/by-nc/4.0/), which permits any noncommercial use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license and indicate if changes were made.

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Volume Title
Proceedings of the International Conference on Intelligent Systems and Digital Transformation (ICISD 2025)
Series
Atlantis Highlights in Intelligent Systems
Publication Date
31 October 2025
ISBN
978-94-6463-866-0
ISSN
2589-4919
DOI
10.2991/978-94-6463-866-0_36How to use a DOI?
Copyright
© 2025 The Author(s)
Open Access
Open Access This chapter is licensed under the terms of the Creative Commons Attribution-NonCommercial 4.0 International License (http://creativecommons.org/licenses/by-nc/4.0/), which permits any noncommercial use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license and indicate if changes were made.

Cite this article

TY  - CONF
AU  - Suneet Adithya Menon
AU  - M. Krishna Ranjan
AU  - Aman Kumar
AU  - J. Arunnehru
PY  - 2025
DA  - 2025/10/31
TI  - Computer Vision Techniques for Enhanced Quality Control in Manufacturing Processes
BT  - Proceedings of the International Conference on Intelligent Systems and Digital Transformation (ICISD 2025)
PB  - Atlantis Press
SP  - 431
EP  - 436
SN  - 2589-4919
UR  - https://doi.org/10.2991/978-94-6463-866-0_36
DO  - 10.2991/978-94-6463-866-0_36
ID  - Menon2025
ER  -