Proceedings of the 2015 International Conference on Intelligent Systems Research and Mechatronics Engineering

2015 International Conference on Intelligent Systems Research and Mechatronics Engineering

📍Zhengzhou, China🗓️ 11-13 April 2015

Interval estimation of reliability parameters in reliability engineering

Authors
Ming Han
Corresponding Author
Ming Han
Available Online April 2015.
DOI
10.2991/isrme-15.2015.189How to use a DOI?
Keywords
reliability engineering, failure rate, exponential distribution, zero-failure data, two-sided confidence limits.
Abstract

For the reliability evaluation of such expensive and high quality products as those used in aviation and spacecraft, this study gives the two-sided confidence limits estimation of reliability parameters for exponential distribution: average life, reliability and reliability life, in the case of zero-failure data. Calculation performed on practical problems show that the provided method is feasible and easy to operation in reliability engineering.

Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Download article (PDF)

Volume Title
Proceedings of the 2015 International Conference on Intelligent Systems Research and Mechatronics Engineering
Series
Advances in Intelligent Systems Research
Publication Date
April 2015
ISBN
978-94-62520-59-2
ISSN
1951-6851
DOI
10.2991/isrme-15.2015.189How to use a DOI?
Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Ming Han
PY  - 2015/04
DA  - 2015/04
TI  - Interval estimation of reliability parameters in reliability engineering
BT  - Proceedings of the 2015 International Conference on Intelligent Systems Research and Mechatronics Engineering
PB  - Atlantis Press
SP  - 913
EP  - 916
SN  - 1951-6851
UR  - https://doi.org/10.2991/isrme-15.2015.189
DO  - 10.2991/isrme-15.2015.189
ID  - Han2015/04
ER  -