AIVA: AI-powered Interview Verbal Analysis System using Fine Tuned Models
- DOI
- 10.2991/978-94-6463-866-0_22How to use a DOI?
- Keywords
- Automated interview analysis; speech-to-text; Indian English accent; Whisper model; large language model (LLM); natural language understanding; transcription accuracy; grammatical error detection
- Abstract
This paper introduces AIVA (AI-powered Interview Verbal Analysis), a novel system that combines advanced speech-to-text technology with natural language processing (NLP) to automate interview analysis. AIVA integrates a fine-tuned Whisper model optimized for Indian English accents with a large language model (LLM) to provide structured JSON outputs and comprehensive assessments of interview performance. The system automatically transcribes interview audio, detects grammatical errors, evaluates technical knowledge, and assesses communication clarity. AIVA achieves 94% transcription accuracy for Indian English and identifies grammatical errors with 87% precision. The novelty of AIVA lies in its ability to perform multi- dimensional, quantitative interview analysis in real time, making it applicable to recruitment, education, and professional development. Keywords: Natural Language Processing, Speech Recognition, Interview Analysis, Fine-tuning, Large Language Models.
- Copyright
- © 2025 The Author(s)
- Open Access
- Open Access This chapter is licensed under the terms of the Creative Commons Attribution-NonCommercial 4.0 International License (http://creativecommons.org/licenses/by-nc/4.0/), which permits any noncommercial use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license and indicate if changes were made.
Cite this article
TY - CONF AU - B. Jaswanth Kumar Reddy AU - B. Sai Charan Reddy AU - Hitendra Singh Shekhawat AU - M. Indumathy PY - 2025 DA - 2025/10/31 TI - AIVA: AI-powered Interview Verbal Analysis System using Fine Tuned Models BT - Proceedings of the International Conference on Intelligent Systems and Digital Transformation (ICISD 2025) PB - Atlantis Press SP - 247 EP - 259 SN - 2589-4919 UR - https://doi.org/10.2991/978-94-6463-866-0_22 DO - 10.2991/978-94-6463-866-0_22 ID - Reddy2025 ER -