Development of a Deep Learning-Based Image Authentication System
- DOI
- 10.2991/978-94-6463-762-5_3How to use a DOI?
- Keywords
- Image Forgery Detection; Error Level Analysis (ELA); Hybrid-Models; Image Forensics; Digital Image Forensics
- Abstract
The broad accessibility of digital image editing tools has been resulted in a significant increase in image forgery, raising serious concerns about the authenticity of visual content. This paper presents a comprehensive comparison of various image forgery detection algorithms, including Convolutional Neural Networks (CNNs)[3], Support Vector Machines (SVMs)[2], and Discrete Wavelet Transforms (DWTs)[1], each assessed for their efficiency in identifying manipulated regions. Additionally, we introduce a novel hybrid approach that combines Error Level Analysis (ELA)[22] and CNNs[11], achieving a remarkable efficiency rate of 95% in detecting tampering techniques such as splicing, copy-move & retouching.Our method is rigorously tested on benchmark datasets, demonstrating its superior performance and reliability. By offering insights into both traditional and advanced detection methods. This research advances the field digital image authentication, providing an effective solution for ensuring the integrity of digital imagery across various domains.
- Copyright
- © 2025 The Author(s)
- Open Access
- Open Access This chapter is licensed under the terms of the Creative Commons Attribution-NonCommercial 4.0 International License (http://creativecommons.org/licenses/by-nc/4.0/), which permits any noncommercial use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license and indicate if changes were made.
Cite this article
TY - CONF AU - Devidas Bhat AU - Nagendra Pai AU - Vasudeva Pai AU - R. Balasubramani PY - 2025 DA - 2025/06/16 TI - Development of a Deep Learning-Based Image Authentication System BT - Proceedings of the International Conference on Materials, Energy, Environment & Manufacturing Sciences & Computational Intelligence and Smart Communication (MEEMS-CISC-2024) PB - Atlantis Press SP - 14 EP - 26 SN - 2352-5401 UR - https://doi.org/10.2991/978-94-6463-762-5_3 DO - 10.2991/978-94-6463-762-5_3 ID - Bhat2025 ER -