Proceedings of the 2025 2nd International Conference on Electrical Engineering and Intelligent Control (EEIC 2025)

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Research on Read Circuits for Wide-temperature STT-MRAM

Authors
Junke Wang1, *
1School of Mechanical and Precision Instrument Engineering, Xi’an University of Technology, Xi’an, 710000, China
*Corresponding author. Email: 853691335@qq.com
Corresponding Author
Junke Wang
Available Online 23 October 2025.
DOI
10.2991/978-94-6463-864-6_30How to use a DOI?
Keywords
STT-MRAM; WIDE-TEMPERATURE; HIGH SENSING MARGIIN
Abstract

STT-MRAM is considered one of the most promising candidates for emerging memory, sense amplifier and next-generation memory. Temperature greatly affects MRAM performance: reading becomes difficult at high temperatures, and writing becomes hard at low temperatures. This article analyzes in detail the impact of temperature on STT-MRAM and explores read circuits optimized for wide temperature ranges.

Copyright
© 2025 The Author(s)
Open Access
Open Access This chapter is licensed under the terms of the Creative Commons Attribution-NonCommercial 4.0 International License (http://creativecommons.org/licenses/by-nc/4.0/), which permits any noncommercial use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license and indicate if changes were made.

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Volume Title
Proceedings of the 2025 2nd International Conference on Electrical Engineering and Intelligent Control (EEIC 2025)
Series
Advances in Engineering Research
Publication Date
23 October 2025
ISBN
978-94-6463-864-6
ISSN
2352-5401
DOI
10.2991/978-94-6463-864-6_30How to use a DOI?
Copyright
© 2025 The Author(s)
Open Access
Open Access This chapter is licensed under the terms of the Creative Commons Attribution-NonCommercial 4.0 International License (http://creativecommons.org/licenses/by-nc/4.0/), which permits any noncommercial use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license and indicate if changes were made.

Cite this article

risenwbib
TY  - CONF
AU  - Junke Wang
PY  - 2025
DA  - 2025/10/23
TI  - Research on Read Circuits for Wide-temperature STT-MRAM
BT  - Proceedings of the 2025 2nd International Conference on Electrical Engineering and Intelligent Control (EEIC 2025)
PB  - Atlantis Press
SP  - 289
EP  - 303
SN  - 2352-5401
UR  - https://doi.org/10.2991/978-94-6463-864-6_30
DO  - 10.2991/978-94-6463-864-6_30
ID  - Wang2025
ER  -